FT-NIR spectroscopy offers quick determination of the physical parameters like thickness, grammage, wet extension and moisture content. Without any sample preparation, all important physical parameters of paper can be determined with one measurement only. Also, on-line monitoring of production process is possible via FT-NIR process spectrometers like MATRIX-F.
FTIR microscopy allows to quickly localize and identify defects in paper. Thus, it is of great use in finding the cause of product defects in failure analysis. Besides the visual analysis and point measurements, it is also possible to perform fully automated grid measurements. Thereby, chemical images are generated showing the distribution of the materials used in paper, such as fillers. Furthermore, it is possible to verify the homogeneity of coatings with a high lateral resolution. With the aid of extensive spectral libraries and efficient functions for the spectra search and mixture analysis, it is possible to identify found components.