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Thin layers, surface analysis

IR-Spectroscopic Analysis of Coatings

IR-Spectroscopic Analysis of Coatings

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Determination of the Degree of Cure of a Varnish

Determination of the Degree of Cure of a Varnish

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Quality Control of DLC layers

Quality Control of DLC layers

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Investigation of Ultrathin Layers with PM-IRRAS

Investigation of Ultrathin Layers with PM-IRRAS

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ATR for Ultrathin Layer Analysis on Si Wafers

ATR for Ultrathin Layer Analysis on Si Wafers

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  • Thin layers, surface analysis
    • IR-Spectroscopic Analysis of Coatings
    • Determination of the Degree of Cure of a Varnish
    • Quality Control of DLC layers
    • Investigation of Ultrathin Layers with PM-IRRAS
    • ATR for Ultrathin Layer Analysis on Si Wafers

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OPTIK INSTRUMENTS s.r.o.

Purkyňova 649/127, Brno, 612 00
Czech Republic


IČO: 27757129
DIČ: CZ27757129

Contact Person

Ing. Jan Neuman Ph.D.

tel.: +420 605 287 732
jan.neuman@brukeroptics.cz