Silicon Characterization
Bruker Optics provides the expertise and leading FTIR spectrometer technology for reliable and non-destructive Silicon quality control with infrared light for photovoltaics and electronics. Benefit from more than 30 years of experience in the field of infrared based semiconductor analysis. Bruker Optics FTIR and RAMAN spectrometers are powerful investigative tools for a whole range of materials.
FTIR Silicon Quality Control:
- CryoSAS industrial Silicon quality control
- Carbon and oxygen content analysis at room temperature
- Measurement of shallow impurities like boron and phosphorous by transmittance and photoluminescence (PL) at low temperature
- According to SEMI, ASTM and DIN standards
Raman spectroscopy is an ideal method for the characterization of the crystalline/amorphous fraction of thin film solar cells. The ratio of the microcrystalline phase is a direct measure for the electrical properties and moreover the quality of the solar cell. It was shown that Raman microscopy is an efficient and sensitive tool for the determination of small changes in crystallinity. As Raman spectroscopy provides results on crystallinity in a fast and non-contact manner it is predestinated for the integration in process lines.
